Description of the method
A single-crystal diffractometer measures the diffraction angles and intensities of an X-ray beam on crystalline materials, from which their crystal structure can be determined. Low-temperature measurements enable the analysis of sensitive or easily decomposable crystals.
Examples of applications
- Structural characterisation of new inorganic and organic compounds
- Validation of theoretical calculations and models
- Verification of crystal quality
- Phase determination
Contact
Prof. Dr Hubert Huppertz
Department of General, Inorganic and Theoretical Chemistry
Innrain 80–82, 6020 Innsbruck
+43 (512) 507 57000
Email Website
- Low-temperature single-crystal diffractometry (down to -196 °C)
Professor Volker Kahlenberg
Institute of Mineralogy and Petrography
Innrain 52, 6020 Innsbruck
+43 (512) 507 54603
Email Website
- In-situ single-crystal diffraction
- Crystal structure analysis of inorganic and organic compounds
- Extensive experience with a wide variety of industrial samples from the ceramics, binders, building materials, glass and waste materials sectors, such as slag and ores.
- Analytical services for industrial partners in Austria and other European countries.
Device details
Single-crystal diffractometer - Oxford Diffraction