X-ray single crystal diffractometry

Single Crystal Diffractometer Stoe IPDS II

2-circle goniometer (ω-range: 180°, Φ-range: unlimited); imaging plate detector with an active scan diameter of 340mm (2θ-max: 77°); graphite monochromatized Mo-Kα radiation; X-ray fibre optic for intensity enhancement; video CCD-camera for centring and determination of the size/shape of the crystal; computer controlled HEATSTREAM high temperature attachment for the temperature range up to 1100K (in-house development in collaboration with Stoe&Cie., J. Appl. Cryst. (2009) 42, 140-142)

image stoe image stoe image stoe

Single Crystal Diffractometer Oxford Diffraction Gemini R Ultra

4-circle kappa-goniometer; 135mm Ruby CCD detector; dual wavelength system: Mo-Kα radiation (graphite monochromator, mono-capillary collimator) & Cu-Ka radiation (multi-layer optics, 300 micron beam size); video CCD-camera for centring and determination of the size/shape of the crystal; Oxford Cryosystems 700 series Cryostream Plus low temperature attachment for the temperature range between 80 and 500K

image oxford image oxford

Single Crystal Diffractometer Siemens P4

4-circle eulerian-cradle goniometer, point detector, non-monochromatized Mo radiation. This diffractometer is specialised for the high-precision measurement of lattice parameters and determination of equation-of-state. The instrument is controlled by the program SINGLE (Angel R.J. and Finger L.W. J. Appl. Crystallogr. 44 (2011) 247–251: "SINGLE: a program to control single crystal diffractometer"; and www.rossangel.com/home.htm).

Siemens P4