Scanning Tunneling Microscope / Atomic Force Microscope

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Maximum size of images 17500nm x 17500nm
Resolution of the images: atomic, if tip is ok
Tip type: Platinum/Iridium for STM, Needle Sensor with piezo for AFM
Sputter Source
Type of Sputter-Target: Silicon 99.999%
Diameter of Sputter-Target: 5cm
Maximum power of sputter source: 1000Watts DC / 400Watts RF
Distance to sample: 33cm
Sputter gas: Argon
Pressure regime for sputtering: 10-2 - 10-1 mbar
Typical experiments
Growth of silicon films on HOPG
Scanning tunneling lithography
Scanning tunneling spectroscopy

Recent publications from this experiment

The publications are collected in the NanoBioDatabase. Loading my take some time.

Diploma and PhD thesis from this experiment

  • Michaela Hager (PhD - ongoing)
  • Michaela Hager (Diploma - 2009)
  • Radula Stijepovic (Diploma - 2009)
  • Stefan Jaksch (PhD - 2009)
  • Stefan Jaksch (Diploma - 2006)
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